Lasers and Electro-Optics Society Annual Meeting, 1994. LEOS '94. Conference Proceedings. IEEE, vol. 2 Book 1997

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1997

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IEEE/Lasers and Electro-Optics Society Publisher

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Analysis of degradation mechanisms in high power AlGaAs 808 nm laser bars
Carrier escape time in quantum well lasers: dependence on injection level, doping concentration, and temperature
Low frequency electrical noise characteristics of broad area 808 nm semiconductor laser diodes