CHARACTERIZATION OF 13um AND 30um THICK HYDROGENATED AMORPHOUS SILICON DIODES DEPOSITED OVER CMOS INTEGRATED CIRCUITS FOR PARTICLE DETECTION APPLICATIONS. Academic Article 2004 uri icon

authors

  • M. Despeisse
  • N. Wyrsch
  • G. Viertel
  • G. Anelli
  • S. Commichau
  • G.Dissertori
  • GARRIGOS SIRVENT, AUSIAS
  • P. Jarron
  • C. Miazza
  • D. Moraes
  • A. Shah

publication date

  • 2004