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RDF description of MICROELECTRONIC ENGINEERING - http://research.umh.es/vivo/pub/revista/0167-9317
type: Document
rights: termsOfUse
date: 2026-08-13T02:30:46
publisher: MICROELECTRONIC ENGINEERING

MICROELECTRONIC ENGINEERING
type: Information Content Entity
publication venue for: Structural analysis of thermally oxidized amorphous SiGe layers
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issn: 0167-9317
type: Journal
publication venue for: Morphology evolution of InSb island grown on InP substrates by atomic layer molecular beam epitaxy
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type: Generically Dependent Continuant
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most specific type: Journal
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Structural analysis of thermally oxidized amorphous SiGe layers
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has publication venue: MICROELECTRONIC ENGINEERING
type: Generically Dependent Continuant
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type: Article
type: Information Content Entity
type: AcademicArticle
type: Year1995
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Morphology evolution of InSb island grown on InP substrates by atomic layer molecular beam epitaxy
type: AcademicArticle
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type: Generically Dependent Continuant
type: Information Content Entity
type: Document
type: Entity
has publication venue: MICROELECTRONIC ENGINEERING
type: Year1998
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